Operation |
Corrsive Acid/Base |
Solvent | Gas RF-Plasma | Rinse/Other | Location |
1.a. Lead clean b. Rinse after all operations |
Acetone or IPA, Ultrasonic optional | Or DI water,
Ultrasonic optional |
Wet sink |
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2.a. Plastic
Package Decap |
Sulphuric, Hot, 270 C |
Jet etcher |
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b. Plastic Package Decap |
Nitric, Fuming,
50 C-80 C |
Wet sink |
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c. Plastic Package Decap |
O2/AR (days) |
Plasma etcher |
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3. Cerdip
Decap (Boe pkg-Mil) |
By product BeO dust |
Mech |
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4. Topside
Passivation Clean |
PAD etch
or BOE: 15-30 Sec |
or Acetone
or IPA, Ultrasonic |
or O2/AR
(minutes) |
or DI Water,
Ultrasonic |
Wet sink |
5. a. Topside
Passivation Strip: VAPOX |
CF4/O2 + O2
0.65 tor, 7-10 min |
Plasma etcher |
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5. b. Nitride | CF4/O2 + O2
0.65 tor, 7-10 min |
Plasma etcher |
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5. c. Finish
Passivation Strip if incomplete |
PAD etch
or BOE: 15-30 Sec |
Wet sink |
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6. Die
Hot spot Analysis |
Liquid Crystal Analysis |
Electrical |
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7. Top
Layer Metal Strip |
CME, hot, 70 C
approx. 2-6 min |
Wet sink |
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8. Intermetal
Dieelectric (IMD) strip |
PAD etch
or BOE: approx: 5-8 min |
Wet sink |
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9. Bottom Layer Metal | CME, hot, 70 C
approx. 2-6 min. |
Wet sink |
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10. Strip to
Silicon All metal Levels |
Caro's Acid
("Piranna etch") H2So4/H2O2 |
Wet sink |
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11.a. Stain 111 Silicon defects |
Sirtl Etch
CrO3 (50%), + HF , 1:1 (no storage) 3-5 min. |
Wet sink |
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11. b. Stain 100 Silicon defects |
Secco Etch
K2Cr2O7 (4.4%), + HF , 1:2 (no storage) 8 - 10 min. |
Wet sink |
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11. c. Stain
111-100 Silicon defects |
Wright Etch
CuNo3(3.3%):2 + CrO3(50%):1 + DI:3 + Nitric:2 + Acetic:2 ( 6. mos. stor. , 10-15m. |
Wet sink |
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12. Polysilicon
Removal: (decreate poly gate) a. Top metal b. LTOs:IM & Metal-Poly c. BOT'M METL d. poly |
a. CME, 70 C
|
Wet sink |
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13. Junction (N+, P+) |
DASH etch
HF(1%) + NO2H(10%) CH3CooH) 10% |
Wet sink |
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14. Other metals | Click here | ||||
15. Other oxide | Click here | ||||
16. Silicon level | Click here | ||||
17. Cross section techniques | Click here | ||||
18. Gas | Click here |